Product Introduction
Founded in 1967, Canada's Proto Corporation is the world's leading manufacturer of X-ray residual stress analyzers. It has first-class technical standards, a wide range of products, a high market share, and strong service capabilities. It is an active promoter and planning participant of multiple international standards.
Proto specializes in the production of 3D triaxial XRD residual stress and retained austenite measurement systems:
LXRD, iXRD, iXRDmini, roboXRD, mXRD, LP200 (Profilometer) Mapping, in accordance with: EU standard EN15305-2008, US standard ASTM E915-2021, ASTM E2860-2020, Japanese standard JSMS-SD-10-2005, mainland standard GB/T 7704-2017.
For more information about ProtoX-ray residual stress analyzer products and services, please visit the professional website www.protoxrd.com www.protoxrd.com
iXRDmini The smallest and most compact portable X- ray residual stress analyzer
It uses two symmetrically arranged photon counting area array detectors (256x256 pixels), with fast speed, high accuracy, good stability and low entry price. It can measure stress under complex conditions such as coarse grains, textures, uneven surfaces and stress gradients.
The equipment uses dual X-ray detectors, full-range goniometers, and sin2ψ multiple exposure technology, and complies with international standards such as ASTM E915 (USA), EN15305 (EU), JSMS-SD-10 (Japan) and GB/T 7704 (China). Collect the data of inclination angles in the ±ψ direction and correctly calculate the shear stress value.。
Built-in 50mm linear stress cloud map guide; user-changeable X-ray tube (designed and manufactured by Proto) to test a variety of materials; fast measurement speed iXRDmini The smallest and most compact portable X- ray residual stress analyzer and high accuracy; the entire set of equipment can be packed into a suitcase for easy carrying.
Proto-iXRD Portable and Laboratory-Used X-Ray Stress Meter
The Proto portable stress tester has the characteristics of fast speed, compact structure and wide application range. The weight of the whole machine does not exceed 32 kg and is not limited by the size of the measured parts. The multi-jointed cobra-shaped arm can measure above, side and below the measured part. Stress meter for laboratory and outdoor use.
Proto-mXRD Handheld X-ray Stress Meter
Ultra-portable mXRD brings a new level of versatility to in-situ residual stress measurements. The system is ideal for use on pipelines, pressure vessels and bridges. It complies with international standards such as ASTM E915 and can be easily packed into a single travel case.
Proto-LXRD High Power Stress Instrument
The Proto-LXRD high-power stress instrument has the characteristics of fast speed, high accuracy, strong stability, and can operate continuously. The minimum slit size is 0.2 mm, and stress measurements of polycrystalline and single crystals can also be performed (pole figure method)
Proto-LXRD Micro Stress Instrument
The Proto micro-area stress meter is a research-level stress meter. Its diffraction geometry includes the co-tilt method, the tilt method, the modified tilt method, etc., and the minimum slit size is 30 um. The LXRD Biaxial is Proto's fully featured state- of-the-art research grade instrument for residual stress measurements. The second Χ(chi) axis can measure the true roll method (in addition to omega and modified roll). XY mapping stages, φ rotation stages, video microscopes and X-ray beam aperture sizes (down to 30 microns) provide advanced tools for your micro-area residual stress measurement needs.
Proto-RoboXRD Six-axis Robot X-ray Stress Instrument
roboXRD is an innovative solution for flexible residual stress measurement. Adapted from our popular iXRD platform, roboXRD takes residual stress measurements to a new level. The system's six-axis robot has a reach of 1210 mm, allowing for easy and accurate measurement of both small and large parts.
Sample Preparation/Accessories
Products and accessories to support your XRD measurements. High power dynamic electrolytic polishing machine, standard samples (with certification): zero, high stress, austenite (%), etc.
XRD powder diffractometer :
Versatile powder diffraction systems including tabletop, compact and floor standing systems. AXRD Benchtop, AXRD Theta-Theta, AXRD LPD, AXRD LPD-HR, LPD-HT
- Phase identification qualitative analysis (search/match COD or ICDD database)
- uantitativephaseanalysis
- Overall fitting model (Rietveld refinement)
- Percent crystallinity
- Grain size and strain
- Lattice constant precision, Miller index, Crystal system analysis
- Retained austenite, residual stress
- Pole Figures and Texture
- XRF elemental analysis using data collected by an SPD detector
- High-resolution analysis: X-ray reflectivity (XRR) [Density, Thickness, Roughness analysis],amorphous layers, polycrystalline layers and single crystal layers can be analyzed.
- High-resolution analysis: rocking curves and reciprocal space diagrams [RC, RSM analysis (Mismatch, Thickness, Composition)
High resolution XRD:
Unparalleled high-resolution X-ray diffractometer for characterization of thin films and single crystal materials.
Single Crystal Diffractometer:
Powerful benchtop system for structural analysis of small molecules and high pressure crystallography.
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Laue single crystal:
Customizable crystal orientation systems for production and R&D.
General single crystal orientation analysis (including data base) and in accordance with Turbine Industry turbine engine standards [US1, US2 angles, European (UK) angles, R-Value (grain boundary orientation of two adjacent grains)
X-ray fluorescence:
Compact XRF systems enhance your elemental analysis and high-resolution mapping capabilities.
List of some typical users among more than 800 users worldwide
